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Oxford Instruments
Великобритания
Добавлен 12 фев 2009
Oxford Instruments leading provider of high technology tools and systems for research and industry.
Enabling tomorrow’s batteries through comprehensive materials analysis
In this webinar, we discuss the use of electron microscopy-based analysis in combination with confocal Raman microscopy/spectroscopy, atomic force microscopy (AFM) and nuclear magnetic resonance (NMR) to provide a holistic and correlated view of battery materials.
Просмотров: 132
Видео
On Resonance: In Conversation with Dr. Ryan Mewis
Просмотров 1112 месяца назад
Our "On Resonance, in conversation with.." series aims to highlight various NMR users, and their applications in benchtop NMR, from a wide range of sectors. Recently we talked with Dr. Ryan Mewis from Manchester Metropolitan University about how he uses benchtop NMR to enhance the teaching of NMR, and how he employs it in his academic research on hyperpolarisation.
On Resonance: In Conversation with Dr. Oliver Sutcliffe
Просмотров 762 месяца назад
Our "On Resonance, in conversation with.." series aims to highlight various NMR users, and their applications in benchtop NMR, from a wide range of sectors. Recently we sat down with Dr. Oliver Sutcliffe from Manchester Metropolitan University about how he uses benchtop NMR in the MANDRAKE (MANchester DRug Analysis and Knowledge Exchange) partnership which employs benchtop NMR to facilitate rob...
BEX Unity Detector - Oxford Instruments
Просмотров 2604 месяца назад
Here you can see the Backscattered Electron and X-ray (BEX) Unity detector in action. Here, we sampled the entire sample in just 5 minutes, changing the process of how we work and opening the door to new applications. With Unity, you can later analyse the data offline, reducing the time spent on the SEM. Discover more today - nano.oxinst.com/unity
Oi View: supporting you & your Oxford Instruments system
Просмотров 2984 месяца назад
Our groundbreaking new digital platform provides real-time insights and immediate access to your Oxford Instruments system health and utilisation via phone, tablet or PC, allowing you to monitor the progress of your live analyses.
Deep Reactive Ion Etching system - PlasmaPro 100 Estrelas - Oxford Instruments
Просмотров 7726 месяцев назад
The PlasmaPro 100 Estrelas platform is designed to give total flexibility for Deep Reactive Ion Etching (DRIE) applications - serving a diverse set of process requirements across the Micro Electromechanical Systems (MEMS), Advanced Packaging and Nanotechnology markets. Developed for research and volume production, the PlasmaPro 100 Estrelas offers the ultimate flexibility with Bosch and Cryogen...
Analysis of battery cathode material with the Unity BEX detector in the SEM - Oxford Instruments
Просмотров 1327 месяцев назад
Battery cathode material is analysed at low resolution on a Hitachi SU 3500 at 20 kV, a working distance of 11 mm, initially at 150x magnification. While in the greyscale BSE image (right) it is impossible to pick out contamination particles, in the coloured BEX image (left) several potential particles for closer inspection are easy to pick out. We zoom in to 350x and capture an image in which ...
Analysing battery cathode material with the Unity BEX detector in SEM - Oxford Instruments
Просмотров 1437 месяцев назад
A battery cathode material is analysed on a Hitachi SU 3500 at 20 kV, a working distance of 10.8 mm and 1500x magnification. The surface is quickly scanned at a lower resolution until apparent contamination is identified which requires closer inspection. We zoom in and an image is rapidly acquired. While the Fe contamination is evident in the BSE and BEX image, it is clear there is Al contamina...
Analysing battery cathode material with the Unity BEX detector in SEM - Oxford Instruments
Просмотров 987 месяцев назад
A battery cathode material is analysed on a Hitachi SU 3500 at 20 kV, a working distance of 10.8 mm and 1500x magnification. The surface is quickly scanned at a lower resolution until apparent contamination is identified which requires closer inspection. We zoom in and an image is rapidly acquired. While the Fe contamination is evident in the BSE and BEX image, it is clear there is Al contamina...
Analysis of battery cathode material with the Unity BEX detector in the SEM - Oxford Instruments
Просмотров 1047 месяцев назад
Battery cathode material is analysed at low resolution on a Hitachi SU 3500 at 20kV, a working distance of 11 mm, initially at 250x magnification. The grey-scale BSE image (right) indicates a mixture of particle types. The BEX colour image tells us that there is a mix predominantly of C, Si, S and Cu. Capturing the image, BEX clearly shows a Ca particle (right) and a Ni particle (left). We navi...
Accelerating Voltage - Oxford Instruments Bitesized Learning
Просмотров 2668 месяцев назад
Learn about choosing an accelerating voltage for Energy-dispersive X-ray spectroscopy (EDS) analysis. Using animated sketches we explain the role of overvoltage and why users might choose to acquire data at lower accelerating voltages. We touch on the role of accelerating voltage on interaction volume and the emission of characteristic X-Ray lines. Finally we compare standard EDS detectors with...
Solid Angle - Oxford Instruments Bitesized Learning
Просмотров 1528 месяцев назад
Learn about the solid angle and Energy-dispersive X-ray spectroscopy (EDS) detectors. Using animated sketches, we demonstrate how a pulse processor removes noise from each step on the voltage ramp to measure the energy per X-ray. We also introduce the concept of process time, the period when the pulse processor averages the signal before and after each step on the voltage ramp. We then define t...
Relate tutorial: How to use the Manual Measurements operator - Oxford Instruments
Просмотров 888 месяцев назад
In this tutorial, you'll learn how the Manual Measurements operator can be used to query your multimodal datasets. Use this operator to measure parameters in your different layers and learn how to display and export tables with your measured parameters.
Relate tutorial 3: How to correlate multimodal microscopy - Oxford Instruments
Просмотров 458 месяцев назад
The third tutorial of the series is about correlation of multimodal datasets. Watch this tutorial to learn how to tackle one of the big challenges of correlative microscopy: image registration. You will see how to use the Colocalization study for correlating and overlaying your multimodal imaging datasets.
Relate tutorial 2: How to load, display and resample your data - Oxford Instruments
Просмотров 578 месяцев назад
In the second tutorial of the series, you will learn how to load and display your datasets as Relate studiables. Not only this but learn how multi-channel (or multi-layer) datasets can be rendered as well as how to use operators to transforms or resample the axes of your studiables.
Relate tutorial 1: How to create and customise Relate documents - Oxford Instruments
Просмотров 568 месяцев назад
Relate tutorial 1: How to create and customise Relate documents - Oxford Instruments
What can Unity, the BEX imaging detector do, and what does the future hold? - Oxford Instruments
Просмотров 1,1 тыс.8 месяцев назад
What can Unity, the BEX imaging detector do, and what does the future hold? - Oxford Instruments
What is benchtop NMR for and why use it?
Просмотров 2339 месяцев назад
What is benchtop NMR for and why use it?
Dead Time and EDS- Oxford Instruments Bitesized Learning
Просмотров 67911 месяцев назад
Dead Time and EDS- Oxford Instruments Bitesized Learning
EDS Sensor Size - Oxford Instruments Bitesized Learning
Просмотров 56211 месяцев назад
EDS Sensor Size - Oxford Instruments Bitesized Learning
Components of an EDS detector - Oxford Instruments Bitesized Learning
Просмотров 58611 месяцев назад
Components of an EDS detector - Oxford Instruments Bitesized Learning
Introduction to EDS - Oxford Instruments Bitesized Learning
Просмотров 73211 месяцев назад
Introduction to EDS - Oxford Instruments Bitesized Learning
- Oxford Instruments NanoScience Introduces the ProteoxS
Просмотров 393Год назад
- Oxford Instruments NanoScience Introduces the ProteoxS
On Resonance: New Insights for tomorrow’s batteries
Просмотров 601Год назад
On Resonance: New Insights for tomorrow’s batteries
Introduction to Unity BEX imaging detector
Просмотров 3,6 тыс.Год назад
Introduction to Unity BEX imaging detector
On resonance: In Conversation with Dr Dave Ellis
Просмотров 890Год назад
On resonance: In Conversation with Dr Dave Ellis
An Overview of WDS & EDS Point Automation in Aztec- Oxford Instruments
Просмотров 723Год назад
An Overview of WDS & EDS Point Automation in Aztec- Oxford Instruments
Part 1: Introduction to WDS and EDS Mapping with AZtecWave
Просмотров 716Год назад
Part 1: Introduction to WDS and EDS Mapping with AZtecWave
Introduction to sample identification in the SEM with AZtecMatch
Просмотров 754Год назад
Introduction to sample identification in the SEM with AZtecMatch
Introduction à la spectrométrie dispersive en longueur d'onde (WDS / WDX)
Просмотров 247Год назад
Introduction à la spectrométrie dispersive en longueur d'onde (WDS / WDX)
Great
Hello, thank you. This is very important information. I have captured some dislocation in SEM_STEM with a very good constant than TEM. Could you please provide some insights into why dislocations we can see easily in STEM mode.
trash
This would be a nice addition to the Aztec software. But, unfortunately, not a single mineralogist participated in the development. Otherwise, the at% and atomic ratios of the elements would be used for identification, as mineralogists usually do. The approach used is unsuitable for identifying minerals of variable composition.
Another way to address the NMI trouble in steels - good presentation.
What is the meaning of following sentence in the process of EDS? Peak Overlap issue is addressed by fitting element peak shapes to the spectrum at every map pixel which results in the deconvolution of overlapped peaks in the spectra of every map pixel.
The sound of ne video is unclear.
I would like to know how I could include the SAMPLE´s NAME in each report. Thank´s so much
For the colors in the elemental mapping, do these colors always indicate the same specific element for each test? For example, is the C element always depicted in red?
I would like to know how I can change one report from oxford, how modificate it (to insert the name of the specimens) Thak you
can you please give the subtiles to videos, it's very academic for non-native to follow without transcrip or subtitles
Do you have the pdf file or ppt file of this lecture sir?
Would be great to see installation of the radiation and thermal shields as well. Is there a lift system implemented to aid with this step?
Background music drowns out the narration.
I have no idea why this was recommended to me, but I'm glad it was. That's freaking cool
Is the default in Aztec for pole figures, 1 point per grain? Or is it 1 point per pixel? And how do we define this in the settings?
The default in AZtecCrystal is to plot 1 point for every measured orientation, however, you can create a subset from the grain list that includes 1 representative point per grain, and plot these in the pole figures instead. Best wishes, Oxford Instruments.
Amazing👍. Thanks for uploading this. Quite informative
Hello, how can I determine the penetration depth of electron beam?
Informative.. Thanks for uploading in simplified manner
What's the price please?
Is an extension planed to include the match data to the phase detection in maps?
Would this work on detecting microfractures in glass?
great explanation! thanks a lot
Thank you.
You mention the low kV thinning necessary to remove implanted gallium. Where does the gallium come from?
Thanks for your question. Implanted gallium is a common side effect of FIB sample preparation as Ga Is typically used as the ion source on the FIB.
Thanks for a better audio upload 😇..
wonderfull
Is AZtecCrytal ODF available in the basic module?
Does this AZtechCrystal MapSweeper is a different module or it is available in AZtech Crystal?
For anyone struggling to listen to the audio in this video, we have re-recorded it with better audio here > ruclips.net/video/He5B_pMmm7s/видео.html
Hello, I really appreciate your video, i found lots of information here. could you please elaborate about the x rays as in TEM the source is electrons rather then x rays. thanks
sound quality very bad and therefore hard to understand for non-native english speaker
thank you so much for this.. there weren't any explanations of ebsd for dummies anywhere but your videos helped me!!
Thanks a lot sir
Subtitles would be better. Pls always use subtitles otherwise your all effort in vain.
Is WDS a good technique to analyse the composition of porous materials (such as sol-gel-derived bioactive glasses)? And why? Are there any studies that discuss this matter?
It depends on what information is sought. For accurate quantitative data then the sample needs to be solid, flat, and polished. Therefore, for porous materials only qualitative WDS results are really possible. For example, WDS could be used to identify what elements are present in a porous sample, but not accurately determine the concentrations of these elements. I am afraid we don’t currently have any studies that have been conducted on porous materials. We hope this helps, Oxford Instruments.
Where can I find the performance of the slit position of the spectrometer-WDS?
The slit is essentially a collimator that sits in front of the detectors. The position of the slit can vary, and the optimal slit position is where is achieves the highest intensity for a given element-line. When a peak search is conducted in the AZtecWave software a slit position scan is performed, which determines the best slit position for the particular element-line. This would be a way of viewing the performance, and how the signal intensity varies with changing slit position. If further information is needed, please email contact us on nano@oxinst.com.
What is the difference compared with dictionary matching?
Hi Lu, AZtecCrystal MapSweeper includes a full indexing method (Dynamic Template Matching - DTM) that has all the benefits of Dictionary Indexing (i.e. the ability to index reliably even very poor quality diffraction patterns) but without the drawbacks (for example, DTM needs no pre-calculation of a library of simulations, can work well for multiple phases, calculates the geometry calibration at every point in the dataset and involves immediate refinement of the solution to give better orientation precision than regular indexing methods). However, for most samples we do not need to use DTM, as MapSweeper’s “Refine” and “Repair” modes utilise pre-existing data (e.g. from Hough-based indexing) to enhance EBSD datasets much more effectively and quickly. Oxford Instruments
How much is the accuracy of EBSD technique plz? Is it possible to detect and study second phase particles of about 2 micron in size, disributed in a metalic matrix?
Hi Max, EBSD can be used to identify second phase particles. Regarding spatial resolution, the technique is limited by the performance of the SEM column and ultimately physics. 2 micron diameter particles should, however, be possible to resolve on most SEMs. We have several application notes showing examples of analysis of particles, such as nano.oxinst.com/campaigns/downloads/aztec-synergy-phase-identification-in-a-high-temperature-steel We hope this helps.
Nice
Thanks, Dr. Haithem for EDS Large Area Mapping in SEM presentation.
It would be nice if Oxford finally would update Aztec so we can finally change the colour of the labels on the micrographs...nice tip the multiple name changing.
Hello, thank you for the feedback. We have passed this on to our developers and will add it to the requested functionality list.
Hello. Is there a way to select multiple spectra from Point ID and apply the same elements for each of them in one step (apart from the solution to do it before taking the sample). I would appreciate your answer. Thanks, Stefan
Hi Stefan, Thanks for your question. The easiest way to do this would be to use the Pre-defined elements tab that is located in the “Describe Specimen” step. Here you can select which elements you want included in your analysis. Once identified you can return to the spectrum and using the “Confirm Elements” step, use “clear all” to remove the Auto ID elements and then click “Pre-defined” to apply the pre-defined element selection.
Very informative. Could you please improve the quality of audio somehow?
Hi there, we have re-recorded this tutorial, which now has better quality audio > ruclips.net/video/He5B_pMmm7s/видео.html
IS THESE WITH TEM ?
is the software can measure the particale sizes birgger then mm , i mean for grain as 10 cm from High quality image ?
Even though it’s informative , the struggle is real with audio
Hi there, we have since re-recorded this tutorial, with better quality audio > ruclips.net/video/He5B_pMmm7s/видео.html